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Browsing by Author Priesol, J.
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Issue Date
Title
Author(s)
2018
Raman spectroscopy used to assess the temperature and mechanical stress in thin films of microelectronic structures
Kadlečíková, M.
;
Vančo, Ĺ
;
Breza, J.
;
Priesol, J.
;
Šatka, A.