Title: Multi-criteria optimization of quality and reliability providing processes of electronic devices
Authors: Bobalo, Jury
Nedostup, Leonid
Kiselychnyk, Myroslav
Melen, Myhaylo
Zayarnyuk, Pavlo
Citation: CPEE – AMTEE 2013: Joint conference Computational Problems of Electrical Engineering and Advanced Methods of the Theory of Electrical Engineering: 4th – 6th September 2013 Roztoky u Křivoklátu, Czech Republic, p. V-4.
Issue Date: 2013
Publisher: University of West Bohemia
Document type: článek
konferenční příspěvek
URI: http://hdl.handle.net/11025/11575
ISBN: 978-80-261-0247-2
Keywords: elektronické zařízení;optimalizace výroby;technologické procesy
Keywords in different language: electronic device;manufacturing optimization;technological processes
Abstract: This paper describes the method of electronic devices manufacturing optimization by technical and economic criteria.
Rights: © University of West Bohemia
Appears in Collections:CPEE – AMTEE 2013

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