Title: Understanding ionizing energy losses after charged particle and neutron impact in semiconductors with hybrid pixel detectors
Authors: Bergmann, Benedikt
Citation: 2022 International Conference on Applied Electronics: Pilsen, 6th – 7th September 2022, Czech Republic, p. 1-4.
Issue Date: 2022
Publisher: Fakulta elektrotechnická ZČU
Document type: konferenční příspěvek
URI: http://hdl.handle.net/11025/49839
ISBN: 978-1-6654-9482-3
Keywords: radiační poškození;pixelové detektory;neionizující ztráta energie;ztráta ionizační energie;detektory částic;neutronové záření
Keywords in different language: neutron radiation;radiation damage;pixel detectors;non-ionizing energy losse (NIEL);ionizing energy losse (IEL);particle detectors
Abstract in different language: Hybrid pixel detectors of Timepix3 technology allow noiseless single particle detection and identification. We exploit this capability for a comprehensive study of ionizing energy losses and their spatial distribution in silicon sensors after exposure to charged particles and neutrons
Rights: © IEEE
Appears in Collections:Applied Electronics 2022
Applied Electronics 2022

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