Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Žídek, Jan | |
| dc.contributor.author | Šubrt, Ondřej | |
| dc.contributor.author | Martínek, Pravoslav | |
| dc.contributor.editor | Pihera, Josef | |
| dc.contributor.editor | Steiner, František | |
| dc.date.accessioned | 2012-10-17T13:06:52Z | |
| dc.date.available | 2012-10-17T13:06:52Z | |
| dc.date.issued | 2009 | |
| dc.identifier.citation | Electroscope, 2009, Konference EDS 2009. | cs |
| dc.identifier.issn | 1802-4564 | |
| dc.identifier.uri | http://147.228.94.30/images/PDF/Rocnik2009/EDS_2009/zidek.pdf | |
| dc.identifier.uri | http://hdl.handle.net/11025/551 | |
| dc.format | 5 s. | cs |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | en | en |
| dc.publisher | Západočeská univerzita v Plzni, Fakulta elektrotechnická | cs |
| dc.relation.ispartofseries | Electroscope | cs |
| dc.rights | Copyright © 2007-2010 Electroscope. All Rights Reserved. | en |
| dc.subject | analogově-digitální konvertory | cs |
| dc.subject | testovací prostředí | cs |
| dc.title | An innovative verification approach for nyquist-rate A/D converters – algorithm and implementation | en |
| dc.type | článek | cs |
| dc.type | konferenční příspěvek | cs |
| dc.type | article | en |
| dc.type | conferenceObject | en |
| dc.rights.access | openAccess | en |
| dc.type.version | publishedVersion | en |
| dc.description.abstract-translated | Environment for testing static parameters of analog-to-digital converters is presented in this article. It is a novel concept of powerful engine suitable for design and verification of generic type ADCs in Mentor Graphics IC Studio software. The source code of each block of the design is written in Verilog-A which offers relatively effortless portability on different design systems (e.g. Cadence). The core of our proposal is based on Servo-Loop with improved search algoritm [1]. The simulation outputs are curves of static INL and DNL. Here, we focus mainly on algorithm and implementation of testing interface. | en |
| dc.subject.translated | analog-to-digital converters | en |
| dc.subject.translated | testing environment | en |
| dc.type.status | Peer-reviewed | en |
| Appears in Collections: | EDS 2009 (2009) | |
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