Title: The influence of environment on properties of thick film components
Authors: Beshajová Pelikánová, Ivana
Běhan, Tomáš
Citation: Electroscope. 2010, č. 4.
Issue Date: 2011
Publisher: Západočeská univerzita v Plzni, Fakulta elektrotechnická
Document type: článek
ISSN: 1802-4564
Keywords: tlusté vrstvy;rezistory;elektrotechnická diagnostika
Keywords in different language: thick films;resistors;eletrical diagnostics
Abstract in different language: The work is focused on investigation of behavior of thick film resistors. The changes of parameters of thick film samples exposed to accelerated ageing were analyzed. The samples were exposed in three types of environment during relatively long time. The samples with different sizes of thick film resistors were prepared. Conductive and resistive structures were deposited on corundum substrates by screen-printing. The silver polymer paste for conductive layer and the carbon black polymer paste for resistive layer were used. The resistance and nonlinearity of current-voltage characteristic were measured. Non-linearity was measured as distortion of sinusoidal AC powering signal. Non-linearity of C-V characteristic is influenced by defect in polymer resistive layer and mechanism of conductivity in non-homogeneous structure of layer.
Rights: Copyright © 2007-2010 Electroscope. All Rights Reserved.
Appears in Collections:Číslo 4 (2010)
Číslo 4 (2010)

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Please use this identifier to cite or link to this item: http://hdl.handle.net/11025/588

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