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DC FieldValueLanguage
dc.contributor.authorJaroš, D.
dc.contributor.authorPavlík, Michal
dc.contributor.editorPihera, Josef
dc.contributor.editorSteiner, František
dc.date.accessioned2012-11-09T10:05:54Z
dc.date.available2012-11-09T10:05:54Z
dc.date.issued2011
dc.identifier.citationElectroscope. 2011, č. 4, EDS 2011.cs
dc.identifier.issn1802-4564
dc.identifier.urihttp://147.228.94.30/images/PDF/Rocnik2011/Cislo4_2011/r5c4c2.pdf
dc.identifier.urihttp://hdl.handle.net/11025/623
dc.format4 s.cs
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherZápadočeská univerzita v Plzni, Fakulta elektrotechnickács
dc.relation.ispartofseriesElectroscopecs
dc.rightsCopyright © 2007-2010 Electroscope. All Rights Reserved.en
dc.subjectvývojové modelycs
dc.subjectW-modelcs
dc.subjectembedded systémcs
dc.subjecttestovánícs
dc.titleW-development model extension for embedded system designen
dc.typečlánekcs
dc.typekonferenční příspěvekcs
dc.typearticleen
dc.typeconferenceObjecten
dc.rights.accessopenAccessen
dc.type.versionpublishedVersionen
dc.description.abstract-translatedAt present time, when complexity of the developed devices rises, the developing models became very important [1], [4]. Following of the defined steps, especially during continuously testing, increase reliability of the developed device and then decrease quality cost. It's mainly due to the error repairing cost exponentially rises depending on the project stage. About 30-40% of the software developing time is spend by testing of the written code [5]. Thanks to the majority of the developing models are oriented on software developing models. Even if we can use them for embedded system testing, they have some imperfections for this purpose. The article describes propose of the W-model extension that includes specialized operations for the embedded systems. Using examples are presented as well.en
dc.subject.translateddeveloping modelsen
dc.subject.translatedW-modelen
dc.subject.translatedembedded systemen
dc.subject.translatedtestingen
dc.type.statusPeer-revieweden
Appears in Collections:Číslo 4 - EDS 2011 (2011)
Číslo 4 - EDS 2011 (2011)

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