Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jaroš, D. | |
dc.contributor.author | Pavlík, Michal | |
dc.contributor.editor | Pihera, Josef | |
dc.contributor.editor | Steiner, František | |
dc.date.accessioned | 2012-11-09T10:05:54Z | |
dc.date.available | 2012-11-09T10:05:54Z | |
dc.date.issued | 2011 | |
dc.identifier.citation | Electroscope. 2011, č. 4, EDS 2011. | cs |
dc.identifier.issn | 1802-4564 | |
dc.identifier.uri | http://147.228.94.30/images/PDF/Rocnik2011/Cislo4_2011/r5c4c2.pdf | |
dc.identifier.uri | http://hdl.handle.net/11025/623 | |
dc.format | 4 s. | cs |
dc.format.mimetype | application/pdf | |
dc.language.iso | en | en |
dc.publisher | Západočeská univerzita v Plzni, Fakulta elektrotechnická | cs |
dc.relation.ispartofseries | Electroscope | cs |
dc.rights | Copyright © 2007-2010 Electroscope. All Rights Reserved. | en |
dc.subject | vývojové modely | cs |
dc.subject | W-model | cs |
dc.subject | embedded systém | cs |
dc.subject | testování | cs |
dc.title | W-development model extension for embedded system design | en |
dc.type | článek | cs |
dc.type | konferenční příspěvek | cs |
dc.type | article | en |
dc.type | conferenceObject | en |
dc.rights.access | openAccess | en |
dc.type.version | publishedVersion | en |
dc.description.abstract-translated | At present time, when complexity of the developed devices rises, the developing models became very important [1], [4]. Following of the defined steps, especially during continuously testing, increase reliability of the developed device and then decrease quality cost. It's mainly due to the error repairing cost exponentially rises depending on the project stage. About 30-40% of the software developing time is spend by testing of the written code [5]. Thanks to the majority of the developing models are oriented on software developing models. Even if we can use them for embedded system testing, they have some imperfections for this purpose. The article describes propose of the W-model extension that includes specialized operations for the embedded systems. Using examples are presented as well. | en |
dc.subject.translated | developing models | en |
dc.subject.translated | W-model | en |
dc.subject.translated | embedded system | en |
dc.subject.translated | testing | en |
dc.type.status | Peer-reviewed | en |
Appears in Collections: | Číslo 4 - EDS 2011 (2011) Číslo 4 - EDS 2011 (2011) |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
r5c4c2.pdf | 642,21 kB | Adobe PDF | View/Open |
Please use this identifier to cite or link to this item:
http://hdl.handle.net/11025/623
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