Title: Optimization of the reliability ensuring of radioelectronic equipment
Authors: Nedostup, Leonid
Kiselychnyk, Myroslav
Zayarnyuk, Pavlo
Citation: CPEE – AMTEE 2015: Joint conference Computational Problems of Electrical Engineering and Advanced Methods of the Theory of Electrical Engineering: 6th – 8th September 2015 Třebíč, Czech Republic, p. III-3.
Issue Date: 2015
Publisher: Západočeská univerzita v Plzni
Document type: konferenční příspěvek
URI: http://cpee.zcu.cz/AMTEE/ArchivedProceedings.aspx
ISBN: 978-80-261-0527-5
Keywords: spolehlivost;optimalizace výroby;závady;parametrická spolehlivost
Keywords in different language: reliability;optimization of manufacturing;defectiveness;parametrical reliability
Abstract in different language: In this paper presents proposals for the REE reliability ensure methods supplement, which allows to optimize the manufacturing process, to calculate the impact of defects, to predicting parametrical reliability. This will improve overall reliability and reduce the cost of its maintenance.
Rights: © University of West Bohemia
Appears in Collections:CPEE – AMTEE 2015

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Please use this identifier to cite or link to this item: http://hdl.handle.net/11025/25740

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