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dc.contributor.authorTeodorescu, Horia-Nicolai L.
dc.date.accessioned2019-09-25T09:29:40Z-
dc.date.available2019-09-25T09:29:40Z-
dc.date.issued2015
dc.identifier.citation2015 International Conference on Applied Electronics: Pilsen, 8th – 9th September 2015, Czech Republic, p.259-262en
dc.identifier.isbn978-80-261-0385-1 (Print)
dc.identifier.isbn978-80-261-0386-8 (Online)
dc.identifier.issn1803-7232 (Print)
dc.identifier.issn1805-9597 (Online)
dc.identifier.urihttp://hdl.handle.net/11025/35134
dc.format4 s.cs
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherZápadočeská univerzita v Plznics
dc.rights© University of West Bohemiaen
dc.subjectrezistorycs
dc.subjectaproximační metodycs
dc.subject1/f šumcs
dc.subjectodporcs
dc.subjectgenerátorycs
dc.subjectelektroencefalografiecs
dc.titleApplicative appraisal of the temperature dependence of the noise in preamplifiers the very low frequency caseen
dc.typekonferenční příspěvekcs
dc.typeconferenceObjecten
dc.rights.accessopenAccessen
dc.type.versionpublishedVersionen
dc.description.abstract-translatedSeveral matters related to noise design for preamplifiers are presented for very low frequencies, also pointing to issues raised by some circuits in the literature, including those with noise cancelling circuits. The changes in excess noise with temperature are of interest in applications such as wearable, where large variations of temperature can occur.en
dc.subject.translatedresistorsen
dc.subject.translatedapproximation methodsen
dc.subject.translated1f noiseen
dc.subject.translatedresistanceen
dc.subject.translatedgeneratoren
dc.subject.translatedelectroencephalographyen
dc.type.statusPeer-revieweden
Appears in Collections:Applied Electronics 2015
Applied Electronics 2015

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