Full metadata record
DC pole | Hodnota | Jazyk |
---|---|---|
dc.contributor.author | Ravasz, Richard | |
dc.contributor.author | Kováč, Martin | |
dc.contributor.author | Stopjaková, Viera | |
dc.contributor.editor | Pinker, Jiří | |
dc.date.accessioned | 2020-11-05T12:46:11Z | |
dc.date.available | 2020-11-05T12:46:11Z | |
dc.date.issued | 2020 | |
dc.identifier.citation | 2020 International Conference on Applied Electronics: Pilsen, 8th – 9h September 2020, Czech Republic. | en |
dc.identifier.isbn | 978-80-261-0891-7 (Print) | |
dc.identifier.isbn | 978-80-261-0892-4 (Online) | |
dc.identifier.issn | 1803-7232 (Print) | |
dc.identifier.issn | 1805-9597 (Online) | |
dc.identifier.uri | http://hdl.handle.net/11025/39919 | |
dc.format | 4 s. | cs |
dc.format.mimetype | application/pdf | |
dc.language.iso | en | en |
dc.publisher | Západočeská univerzita v Plzni | cs |
dc.rights | © Západočeská univerzita v Plzni | cs |
dc.subject | čerpadlo | cs |
dc.subject | ultra nízké napětí | cs |
dc.subject | experimentální zkušební deska | cs |
dc.title | Experimental Verification of a Ultra-Low Voltage Charge Pump | en |
dc.type | conferenceObject | en |
dc.type | konferenční příspěvek | cs |
dc.rights.access | openAccess | en |
dc.type.version | publishedVersion | en |
dc.description.abstract-translated | This paper deals with the analysis of across coupled charge pump designed in a 130 nm CMOStechnology with ultra low power supply voltage. Wepropose a printed circuit board, designed to experimen-tally verify this integrated circuit. The test board wasdesigned to verify all function blocks of the charge pumpindependently, as well as the charge pump circuit as awhole. The charge pump was designed to operate at asupply voltage of 200 mV and the switching frequencyof 100 kHz. The achieved experimental results provethe correct functionality of the designed charge pumpintegrated circuit. | en |
dc.subject.translated | charge pump | en |
dc.subject.translated | ultra low voltage design | en |
dc.subject.translated | experimental test board | en |
dc.type.status | Peer-reviewed | en |
Vyskytuje se v kolekcích: | Applied Electronics 2020 Applied Electronics 2020 |
Soubory připojené k záznamu:
Soubor | Popis | Velikost | Formát | |
---|---|---|---|---|
09232719.pdf | Plný text | 14,75 MB | Adobe PDF | Zobrazit/otevřít |
Použijte tento identifikátor k citaci nebo jako odkaz na tento záznam:
http://hdl.handle.net/11025/39919
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