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dc.contributor.authorAbdulhameed, Abdulghafor A.
dc.contributor.authorKubík, Zdeněk
dc.contributor.editorPinker, Jiří
dc.date.accessioned2021-10-27T07:07:18Z
dc.date.available2021-10-27T07:07:18Z
dc.date.issued2021
dc.identifier.citation2021 International Conference on Applied Electronics: Pilsen, 7th – 8th September 2021, Czech Republic, p. 1-4.en
dc.identifier.isbn978–80–261–0972–3 (Print)
dc.identifier.isbn978–80–261–0973–0 (Online)
dc.identifier.issn1803–7232 (Print)
dc.identifier.issn1805–9597 (Online)
dc.identifier.urihttp://hdl.handle.net/11025/45553
dc.description.sponsorshipproject OP VVV Electrical Engineering Technologies with High-Level of Embedded Intelligence CZ.02.1.01/0.0/0.0/18_069/0009855, SGS 2021-005: Research, development and implementation of modern electronic and informationen
dc.format4 s.cs
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherUniversity of West Bohemiaen
dc.rights© University of West Bohemia, 2021en
dc.subjectDUTcs
dc.subjectaplikace EMCcs
dc.subjectmagnetické polecs
dc.subjectmikropásková sondacs
dc.titleDesign and Modeling of Spiral Circular Magnetic Probe for Near Field Measurements in CST Microwave Studioen
dc.typeconferenceObjecten
dc.typekonferenční příspěvekcs
dc.rights.accessopenAccessen
dc.type.versionpublishedVersionen
dc.description.abstract-translatedThis paper presents the designing, modeling, and simulation of the spiral circular magnetic field probe for near field measurements. Two configurations of this probe have been investigated using both reference boards – conventional and microstrip. Furthermore, this probe has a compact size of (4×5) mm2 printed on an FR-4 substrate of 1.6 mm height. This probe's operation frequency covers a range from 1 MHz to 1 GHz, making it suitable to measure the electromagnetic interference in the near field region over PCB working at electromagnetic compatibility applications.en
dc.subject.translatedDUTen
dc.subject.translatedEMC applicationen
dc.subject.translatedmagnetic fielden
dc.subject.translatedmicrostrip probeen
dc.type.statusPeer-revieweden
Appears in Collections:Konferenční příspěvky / Conference Papers (KEI)
Applied Electronics 2021
Applied Electronics 2021

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