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dc.contributor.authorBergmann, Benedikt
dc.contributor.authorSmolyanskiy, Petr
dc.contributor.authorBurian, Petr
dc.contributor.authorPospíšil, Stanislav
dc.date.accessioned2023-02-06T11:00:22Z-
dc.date.available2023-02-06T11:00:22Z-
dc.date.issued2022
dc.identifier.citationBERGMANN, B. SMOLYANSKIY, P. BURIAN, P. POSPÍŠIL, S. Experimental study of the adaptive gain feature for improved position-sensitive ion spectroscopy with Timepix2 . Journal of Instrumentation, 2022, roč. 17, č. 1, s. nestránkováno. ISSN: 1748-0221cs
dc.identifier.issn1748-0221
dc.identifier.uri2-s2.0-85125543199
dc.identifier.urihttp://hdl.handle.net/11025/51326
dc.description.abstractIn the present work, we study the Timepix2 pixels' high energy response in the so-called adaptive gain mode. Therefore, Timepix2 with a 500 μm thick silicon sensor was irradiated with protons of energies in the range from 400 keV to 2 MeV and α-particles of 5.5 MeV from 241Am. A novel method was developed to determine the energy deposit in single pixels of particle imprints, which are spread out over a set of neighbor pixels (cluster). We show that each pixel is capable of measuring the deposited energy from 4 keV up to ∼3.2 MeV. Reconstructing the full energy content of the clusters, we found relative energy resolutions (σE) better than 2.7% and better than 4% for proton and α-particle data, respectively. In a simple experiment with a 5.5 MeV α-particle source, we demonstrate that energy losses in thin (organic) specimen can be spatially resolved, mapping out sample thickness variations, with a resolution around 1-2 μm, across the sensor area. The inherent spatial resolution of the device was determined to be 350 nm in the best case.de
dc.format10 s.cs
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherIOP Publishingen
dc.relation.ispartofseriesJournal of Instrumentationen
dc.rightsPlný text není přístupný.cs
dc.rights© IOP Publishing Ltd and Sissa Medialaben
dc.titleExperimental study of the adaptive gain feature for improved position-sensitive ion spectroscopy with Timepix2en
dc.typečlánekcs
dc.typearticleen
dc.rights.accessclosedAccessen
dc.type.versionpublishedVersionen
dc.description.abstract-translatedIn the present work, we study the Timepix2 pixels' high energy response in the so-called adaptive gain mode. Therefore, Timepix2 with a 500 μm thick silicon sensor was irradiated with protons of energies in the range from 400 keV to 2 MeV and α-particles of 5.5 MeV from 241Am. A novel method was developed to determine the energy deposit in single pixels of particle imprints, which are spread out over a set of neighbor pixels (cluster). We show that each pixel is capable of measuring the deposited energy from 4 keV up to ∼3.2 MeV. Reconstructing the full energy content of the clusters, we found relative energy resolutions (σE) better than 2.7% and better than 4% for proton and α-particle data, respectively. In a simple experiment with a 5.5 MeV α-particle source, we demonstrate that energy losses in thin (organic) specimen can be spatially resolved, mapping out sample thickness variations, with a resolution around 1-2 μm, across the sensor area. The inherent spatial resolution of the device was determined to be 350 nm in the best case.en
dc.subject.translatedpattern recognition, cluster finding, calibration and fitting methodsen
dc.subject.translatedradiation monitoringen
dc.subject.translatedspectrometersen
dc.identifier.doi10.1088/1748-0221/17/01/C01025
dc.type.statusPeer-revieweden
dc.identifier.document-number757419300004
dc.identifier.obd43938087
dc.project.IDEF16_019/0000766/Inženýrské aplikace fyziky mikrosvětacs
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