Název: Influence of Prolonged Mixing of Silicon Dioxide Nanoparticles on the Electrical Properties of Resin Nanocomposites
Autoři: Michal, Ondřej
Mentlík, Václav
Hornak, Jaroslav
Citace zdrojového dokumentu: MICHAL, O. MENTLÍK, V. HORNAK, J. Influence of Prolonged Mixing of Silicon Dioxide Nanoparticles on the Electrical Properties of Resin Nanocomposites. In AIP Conference proceedings. Melville: American Institute of Physics Inc., 2023. s. 040018-1- 040018-6. ISBN: 978-0-7354-4479-9 , ISSN: 0094-243X
Datum vydání: 2023
Nakladatel: American Institute of Physics Inc.
Typ dokumentu: konferenční příspěvek
ConferenceObject
URI: 2-s2.0-85160255563
http://hdl.handle.net/11025/52969
ISBN: 978-0-7354-4479-9
ISSN: 0094-243X
Klíčová slova v dalším jazyce: polyester;nanocomposites;ultrasonic mixing;nanoparticles
Abstrakt v dalším jazyce: In today's world, scientists are focusing on developing new materials that provide lower costs, environmental sustainability or increased capabilities. One way to develop new materials is to modify conventional types already established in industry. An example is the development of composite materials with different types of matrices or fillers. In the last two decades, scientific work has mainly focused on the incorporation of nanofillers into conventional and used matrices such as resins, thermoplastics such as polyethylene or others. One of the issues in performing these modifications is the process of incorporation of nanoparticles into matrices, which is problematic in many aspects. This paper focuses on the effect of silica nanoparticles with different incorporation methods into polyester-imide resin (PEI). The main objective of this experiment was to find the optimal way of the process of mixing nanoparticles with the resin. Thus, this optimal process can be used in follow-up experiments to develop a new type of insulating material for high voltage applications. In this experiment, conventional dielectric parameters such as relative permittivity, dissipation factor, volume resistivity and dielectric strength were diagnosed.
Práva: © The Author(s)
Vyskytuje se v kolekcích:Konferenční příspěvky / Conference Papers (KET)
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