Title: W-development model extension for embedded system design
Authors: Jaroš, D.
Pavlík, Michal
Citation: Electroscope. 2011, č. 4, EDS 2011.
Issue Date: 2011
Publisher: Západočeská univerzita v Plzni, Fakulta elektrotechnická
Document type: článek
konferenční příspěvek
ISSN: 1802-4564
Keywords: vývojové modely;W-model;embedded systém;testování
Keywords in different language: developing models;W-model;embedded system;testing
Abstract in different language: At present time, when complexity of the developed devices rises, the developing models became very important [1], [4]. Following of the defined steps, especially during continuously testing, increase reliability of the developed device and then decrease quality cost. It's mainly due to the error repairing cost exponentially rises depending on the project stage. About 30-40% of the software developing time is spend by testing of the written code [5]. Thanks to the majority of the developing models are oriented on software developing models. Even if we can use them for embedded system testing, they have some imperfections for this purpose. The article describes propose of the W-model extension that includes specialized operations for the embedded systems. Using examples are presented as well.
Rights: Copyright © 2007-2010 Electroscope. All Rights Reserved.
Appears in Collections:Číslo 4 - EDS 2011 (2011)
Číslo 4 - EDS 2011 (2011)

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