Title: The Possibility of Capturing Shock Waves by Computer Simulation in Environmental Scanning Electron Microscope
Authors: Vyroubal, Petr
Citation: Electroscope. 2013, č. 5, EEICT + EDS.
Issue Date: 2013
Publisher: Západočeská univerzita v Plzni, Fakulta elektrotechnická
Document type: článek
ISSN: 1802-4564
Keywords: rázová vlna;scintilační detektor;mikroskopické metody;environmentální rastrovací elektronový mikroskop;počítačová simulace
Keywords in different language: shock wave;scintilation detector;microscopic methods;environmental scanning electron microscope;computer simulation
Abstract in different language: Environmental scanning electron microscope (ESEM) is one of the latest trends in microscopic methods. In this microscope, we can observe various types of specimens, especially non-conductive and wet specimens. This is given by high pressure of gas in the specimen chamber. The evaluation of pressure on the secondary electrons trajectory is one of the important parameter in design of scintillation detector of secondary electrons. This article deals with computational modelling of pressure conditions and shock waves generation in the scintillation detector of secondary electrons for this type of microscope.
Rights: © 2013 Electroscope. All rights reserved.
Appears in Collections:Číslo 5 (2013)
Číslo 5 (2013)

Files in This Item:
File Description SizeFormat 
r7c5c3.pdfPlný text363,04 kBAdobe PDFView/Open

Please use this identifier to cite or link to this item: http://hdl.handle.net/11025/6619

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.