| Title: | Noise influence on 2D unwrapping |
| Authors: | Kubásek, Radek Kunc, Martin |
| Citation: | AMTEE ’07 : seventh international conference on Advanced Methods in the Theory of Electrical Engineering : September 10-12, 2007 [Pilsen, Czech Republic]. |
| Issue Date: | 2007 |
| Publisher: | University of West Bohemia |
| Document type: | konferenční příspěvek conferenceObject |
| URI: | http://amtee.zcu.cz/AMTEE/ArchivedProceedings/proceedings_AMTEE_2007/data/section_i.html http://hdl.handle.net/11025/25789 |
| ISBN: | 978-80-7043-564-9 |
| Keywords: | hluk;2D data;obraz |
| Keywords in different language: | noise;2D data;image |
| Abstract in different language: | Paper describe influence of additive noise on unwrapping process. Noisy 2D-data, an image, is very hard to unwrap, mainly for low S/N ratio. By denoising, we can achieve a significant better result. Paper give us a global overview and shows basic dependencies between noise and unwrapped data quality. |
| Rights: | © University of West Bohemia |
| Appears in Collections: | CPEE – AMTEE 2007 CPEE – AMTEE 2007 |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Kubasek.pdf | Plný text | 1,74 MB | Adobe PDF | View/Open |
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