Title: | Detekce elektroluminiscence fotovoltaických článků pomocí levné digitální zrcadlovky |
Other Titles: | Usage of low cost digital camera for detecting of silicon solar cell electroluminiscence |
Authors: | Vaněk, Jiří Lepík, Pavel |
Citation: | FIŘT, Jaroslav ed. Elektrotechnika a informatika: XVIII. ročník konference doktorských prací Zámek Nečtiny, 26. – 27. října 2017. Vyd. 1. Plzeň: Západočeská univerzita v Plzni, 2017, s. [43-47]. |
Issue Date: | 2017 |
Publisher: | Západočeská univerzita v Plzni |
Document type: | konferenční příspěvek conferenceObject |
URI: | http://hdl.handle.net/11025/26450 |
ISBN: | 978–80–261–0712–5 |
Keywords: | CMOS kamera;detekce závad;diagnostické metody;elektroluminiscence;fotovoltaika;fotovoltaický článek;solární panel;křemík |
Keywords in different language: | CMOS camera;defect detection;diagnostic methods;elektroluminiscence;photovoltaics;photovoltaic cell;solar cell;silicon |
Abstract in different language: | This article analyses the existing methods both practically and theoretically used to detect defected surface area in solar cells. Various methods were used but by using an upgraded camera with CMOS sensor for carrying out the electroluminescence method, this has proven to have a very crucial impact on the results. Given the overall results and the acquired information, a procedure with a simple parameter can be setup to carry out the measurements. In addition to this a catalog was formed showing the defects occurring in mono and polycrystalline solar cells. |
Rights: | © Západočeská univerzita v Plzni |
Appears in Collections: | 2017 2017 |
Please use this identifier to cite or link to this item:
http://hdl.handle.net/11025/26450
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