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dc.contributor.authorMetshein, Margus
dc.contributor.editorPinker, Jiří
dc.date.accessioned2019-10-08T11:57:33Z
dc.date.available2019-10-08T11:57:33Z
dc.date.issued2016
dc.identifier.citation2016 International Conference on Applied Electronics: Pilsen, 6th – 7th September 2016, Czech Republic, p.173-176.en
dc.identifier.isbn978–80–261–0601–2 (Print)
dc.identifier.isbn978–80–261–0602–9 (Online)
dc.identifier.issn1803–7232 (Print)
dc.identifier.issn1805–9597 (Online)
dc.identifier.urihttp://hdl.handle.net/11025/35240
dc.format4 s.cs
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherZápadočeská univerzita v Plznics
dc.rights© Západočeská univerzita v Plznics
dc.subjectměření napětícs
dc.subjectměření prouducs
dc.subjecttranzistor JFETcs
dc.subjectrezistorycs
dc.subjectimpedancecs
dc.subjectměření frekvencecs
dc.titleHardware imitation of the varying bioelectrical impedance for testing the device for measurement of the impedance of human trunk by using a JFETen
dc.typekonferenční příspěvekcs
dc.typeconferenceObjecten
dc.rights.accessopenAccessen
dc.type.versionpublishedVersionen
dc.description.abstract-translatedIn this paper an approach of imitating the periodically varying electrical bioimpedance of human trunk in case of breathing by using a field effect transistor is presented. The principles of creating a simulation model and preparing a prototype of electronic measurement device, are described. The experiments are presented and the results are compared concerning the change of channel resistance of the field effect transistor and change of real part of impedance of trunk, caused by breathing. The problems of high frequency capacitive measurements and the impact on the design of electronic measurement device are discussed. The results are showing the possibility of using a field effect transistor for imitating breathing. This is a most suitable way of simulation because of the relatively high operating frequency of impedance measurement device needed in the case of using the capacitive electrodes.en
dc.subject.translatedvoltage measurementen
dc.subject.translatedcurrent measurementen
dc.subject.translatedJFETsen
dc.subject.translatedresistorsen
dc.subject.translatedimpedanceen
dc.subject.translatedfrequency measurementen
dc.type.statusPeer-revieweden
Appears in Collections:Applied Electronics 2016
Applied Electronics 2016

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