Full metadata record
| DC pole | Hodnota | Jazyk |
|---|---|---|
| dc.contributor.author | Bergmann, Benedikt | |
| dc.contributor.editor | Pinker, Jiří | |
| dc.date.accessioned | 2022-11-03T13:32:21Z | |
| dc.date.available | 2022-11-03T13:32:21Z | |
| dc.date.issued | 2022 | |
| dc.identifier.citation | 2022 International Conference on Applied Electronics: Pilsen, 6th – 7th September 2022, Czech Republic, p. 1-4. | en |
| dc.identifier.isbn | 978-1-6654-9482-3 | |
| dc.identifier.uri | http://hdl.handle.net/11025/49839 | |
| dc.description.sponsorship | The work has been done in the frame of the Medipix collaboration. This work has benefited from the use of the Los Alamos Neutron Science Center at LANL. This facility is funded by the U.S. Department of Energy under Contract No. DE-AC52-06NA25396. | cs |
| dc.format | 4 s. | cs |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | en | en |
| dc.publisher | Fakulta elektrotechnická ZČU | cs |
| dc.rights | © IEEE | en |
| dc.subject | radiační poškození | cs |
| dc.subject | pixelové detektory | cs |
| dc.subject | neionizující ztráta energie | cs |
| dc.subject | ztráta ionizační energie | cs |
| dc.subject | detektory částic | cs |
| dc.subject | neutronové záření | cs |
| dc.title | Understanding ionizing energy losses after charged particle and neutron impact in semiconductors with hybrid pixel detectors | en |
| dc.type | konferenční příspěvek | cs |
| dc.type | conferenceObject | en |
| dc.rights.access | openAccess | en |
| dc.type.version | publishedVersion | en |
| dc.description.abstract-translated | Hybrid pixel detectors of Timepix3 technology allow noiseless single particle detection and identification. We exploit this capability for a comprehensive study of ionizing energy losses and their spatial distribution in silicon sensors after exposure to charged particles and neutrons | en |
| dc.subject.translated | neutron radiation | en |
| dc.subject.translated | radiation damage | en |
| dc.subject.translated | pixel detectors | en |
| dc.subject.translated | non-ionizing energy losse (NIEL) | en |
| dc.subject.translated | ionizing energy losse (IEL) | en |
| dc.subject.translated | particle detectors | en |
| dc.type.status | Peer-reviewed | en |
| Vyskytuje se v kolekcích: | Applied Electronics 2022 Applied Electronics 2022 | |
Soubory připojené k záznamu:
| Soubor | Popis | Velikost | Formát | |
|---|---|---|---|---|
| Understanding_ionizing_energy_losses_after_charged_particle_and_neutron_impact_in_semiconductors_with_hybrid_pixel_detectors.pdf | Plný text | 1,77 MB | Adobe PDF | Zobrazit/otevřít |
| uvod.pdf | Plný text | 1,61 MB | Adobe PDF | Zobrazit/otevřít |
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