| Title: | Understanding ionizing energy losses after charged particle and neutron impact in semiconductors with hybrid pixel detectors |
| Authors: | Bergmann, Benedikt |
| Citation: | 2022 International Conference on Applied Electronics: Pilsen, 6th – 7th September 2022, Czech Republic, p. 1-4. |
| Issue Date: | 2022 |
| Publisher: | Fakulta elektrotechnická ZČU |
| Document type: | konferenční příspěvek conferenceObject |
| URI: | http://hdl.handle.net/11025/49839 |
| ISBN: | 978-1-6654-9482-3 |
| Keywords: | radiační poškození;pixelové detektory;neionizující ztráta energie;ztráta ionizační energie;detektory částic;neutronové záření |
| Keywords in different language: | neutron radiation;radiation damage;pixel detectors;non-ionizing energy losse (NIEL);ionizing energy losse (IEL);particle detectors |
| Abstract in different language: | Hybrid pixel detectors of Timepix3 technology allow noiseless single particle detection and identification. We exploit this capability for a comprehensive study of ionizing energy losses and their spatial distribution in silicon sensors after exposure to charged particles and neutrons |
| Rights: | © IEEE |
| Appears in Collections: | Applied Electronics 2022 Applied Electronics 2022 |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Understanding_ionizing_energy_losses_after_charged_particle_and_neutron_impact_in_semiconductors_with_hybrid_pixel_detectors.pdf | Plný text | 1,77 MB | Adobe PDF | View/Open |
| uvod.pdf | Plný text | 1,61 MB | Adobe PDF | View/Open |
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