Full metadata record
| DC pole | Hodnota | Jazyk |
|---|---|---|
| dc.contributor.author | Rous, Pavel | |
| dc.contributor.author | Přibek, Petr | |
| dc.contributor.author | Steiner, František | |
| dc.date.accessioned | 2022-12-05T11:00:18Z | - |
| dc.date.available | 2022-12-05T11:00:18Z | - |
| dc.date.issued | 2022 | |
| dc.identifier.citation | ROUS, P. PŘIBEK, P. STEINER, F. Influence Of Thermal Aging On Intermetallic Compound Growth In Solder Alloys. In Proceedings of the 2022 International Conference on Diagnostics in Electrical Engineering (Diagnostika) : CDEE 2022. Pilsen: University of West Bohemia in Pilsen, 2022. s. nestránkováno. ISBN: 978-1-66548-082-6 | cs |
| dc.identifier.isbn | 978-1-66548-082-6 | |
| dc.identifier.uri | 2-s2.0-85141358676 | |
| dc.identifier.uri | http://hdl.handle.net/11025/50539 | |
| dc.format | 5 s. | cs |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | en | en |
| dc.publisher | University of West Bohemia in Pilsen | en |
| dc.relation.ispartofseries | Proceedings of the 2022 International Conference on Diagnostics in Electrical Engineering (Diagnostika) : CDEE 2022 | en |
| dc.rights | © IEEE | en |
| dc.title | Influence Of Thermal Aging On Intermetallic Compound Growth In Solder Alloys | en |
| dc.type | konferenční příspěvek | cs |
| dc.type | ConferenceObject | en |
| dc.rights.access | openAccess | en |
| dc.type.version | publishedVersion | en |
| dc.description.abstract-translated | This article will present the influence of thermal aging and the reflow cycle numbers on intermetallic layer growth. Search for the new soldering alloy brings a new and different combination of elements, which behave differently in work conditions. The objects of the experiment are five types of solder alloys, the referential alloy is SAC compared to SnNi based solder alloys combined with germanium, cobalt, phosphor, and copper elements. The results of the experiment will be the thickness of intermetallic layers between the copper pad and solder alloys in different combinations of thermal aging and reflow cycles. Values will be supported by the elemental analysis by the electron microscope using an EDS (Energy-dispersive X-ray spectroscopy) analysis. More details about the solder alloys and settings reflow and aging processes will be presented in the paper. | en |
| dc.subject.translated | intermetallic compound | en |
| dc.subject.translated | intermetallic layers | en |
| dc.subject.translated | solder alloy | en |
| dc.subject.translated | thermal aging | en |
| dc.subject.translated | reflow soldering | en |
| dc.identifier.doi | 10.1109/Diagnostika55131.2022.9905224 | |
| dc.type.status | Peer-reviewed | en |
| dc.identifier.obd | 43937049 | |
| dc.project.ID | SGS-2021-003/Materiály, technologie a diagnostika v elektrotechnice | cs |
| dc.project.ID | EF18_069/0009855/Elektrotechnické technologie s vysokým podílem vestavěné inteligence | cs |
| Vyskytuje se v kolekcích: | OBD | |
Soubory připojené k záznamu:
| Soubor | Velikost | Formát | |
|---|---|---|---|
| Rous_Influence_Of_Thermal.pdf | 1,89 MB | Adobe PDF | Zobrazit/otevřít |
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