Název: | Experimental study of the adaptive gain feature for improved position-sensitive ion spectroscopy with Timepix2 |
Autoři: | Bergmann, Benedikt Smolyanskiy, Petr Burian, Petr Pospíšil, Stanislav |
Citace zdrojového dokumentu: | BERGMANN, B. SMOLYANSKIY, P. BURIAN, P. POSPÍŠIL, S. Experimental study of the adaptive gain feature for improved position-sensitive ion spectroscopy with Timepix2 . Journal of Instrumentation, 2022, roč. 17, č. 1, s. nestránkováno. ISSN: 1748-0221 |
Datum vydání: | 2022 |
Nakladatel: | IOP Publishing |
Typ dokumentu: | článek article |
URI: | 2-s2.0-85125543199 http://hdl.handle.net/11025/51326 |
ISSN: | 1748-0221 |
Klíčová slova v dalším jazyce: | pattern recognition, cluster finding, calibration and fitting methods;radiation monitoring;spectrometers |
Abstrakt: | In the present work, we study the Timepix2 pixels' high energy response in the so-called adaptive gain mode. Therefore, Timepix2 with a 500 μm thick silicon sensor was irradiated with protons of energies in the range from 400 keV to 2 MeV and α-particles of 5.5 MeV from 241Am. A novel method was developed to determine the energy deposit in single pixels of particle imprints, which are spread out over a set of neighbor pixels (cluster). We show that each pixel is capable of measuring the deposited energy from 4 keV up to ∼3.2 MeV. Reconstructing the full energy content of the clusters, we found relative energy resolutions (σE) better than 2.7% and better than 4% for proton and α-particle data, respectively. In a simple experiment with a 5.5 MeV α-particle source, we demonstrate that energy losses in thin (organic) specimen can be spatially resolved, mapping out sample thickness variations, with a resolution around 1-2 μm, across the sensor area. The inherent spatial resolution of the device was determined to be 350 nm in the best case. |
Abstrakt v dalším jazyce: | In the present work, we study the Timepix2 pixels' high energy response in the so-called adaptive gain mode. Therefore, Timepix2 with a 500 μm thick silicon sensor was irradiated with protons of energies in the range from 400 keV to 2 MeV and α-particles of 5.5 MeV from 241Am. A novel method was developed to determine the energy deposit in single pixels of particle imprints, which are spread out over a set of neighbor pixels (cluster). We show that each pixel is capable of measuring the deposited energy from 4 keV up to ∼3.2 MeV. Reconstructing the full energy content of the clusters, we found relative energy resolutions (σE) better than 2.7% and better than 4% for proton and α-particle data, respectively. In a simple experiment with a 5.5 MeV α-particle source, we demonstrate that energy losses in thin (organic) specimen can be spatially resolved, mapping out sample thickness variations, with a resolution around 1-2 μm, across the sensor area. The inherent spatial resolution of the device was determined to be 350 nm in the best case. |
Práva: | Plný text není přístupný. © IOP Publishing Ltd and Sissa Medialab |
Vyskytuje se v kolekcích: | Články / Articles (RICE) OBD |
Soubory připojené k záznamu:
Soubor | Velikost | Formát | |
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Bergmann_2022_J._Inst._17_C01025.pdf | 2,16 MB | Adobe PDF | Zobrazit/otevřít Vyžádat kopii |
Použijte tento identifikátor k citaci nebo jako odkaz na tento záznam:
http://hdl.handle.net/11025/51326
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