| Title: | Noise spectroscopy of shallow traps in CdTe crystals |
| Authors: | Schauer, Pavel |
| Citation: | Electroscope. 2010, č. 3, EDS 2010. |
| Issue Date: | 2010 |
| Publisher: | Západočeská univerzita v Plzni, Fakulta elektrotechnická |
| Document type: | konferenční příspěvek conferenceObject |
| URI: | http://147.228.94.30/images/PDF/Rocnik2010/Cislo3_2010_EDS/r4c3c13.pdf http://hdl.handle.net/11025/586 |
| ISSN: | 1802-4564 |
| Keywords: | noise spectroscopy;shallow traps;CdTe crystals |
| Keywords in different language: | zvuková spektroskopie;mělké pasti;krytaly CdTe |
| Abstract in different language: | We introduce the noise traps spectroscopy, which is a method of material characterization. This method makes it possible to localize the shallow traps and find out their parameters. It is based on the measurement of the current noise spectral density versus temperature plots for different energies of the sample illuminating monochromatic light. All traps energies can be found in papers of other authors. |
| Rights: | Copyright © 2007-2010 Electroscope. All Rights Reserved. |
| Appears in Collections: | Číslo 3 - EDS 2010 (2010) Číslo 3 - EDS 2010 (2010) |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| r4c3c13.pdf | 184,47 kB | Adobe PDF | View/Open |
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