Title: Evaluation of the functional suitability of the device considering the technological parameters of random deviations from the nominal component aging processes
Authors: Stakhiv, Petro
Krepych, Svitlana
Bobalo, Yuriy
Citation: CPEE – AMTEE 2013: Joint conference Computational Problems of Electrical Engineering and Advanced Methods of the Theory of Electrical Engineering: 4th – 6th September 2013 Roztoky u Křivoklátu, Czech Republic, p. VII-5.
Issue Date: 2013
Publisher: University of West Bohemia
Document type: článek
konferenční příspěvek
article
conferenceObject
URI: http://hdl.handle.net/11025/11559
ISBN: 978-80-261-0247-2
Keywords: elektrická zařízení;procesy stárnutí;funkční vhodnost zařízení
Keywords in different language: electric devices;aging processes;functional device suitability
Abstract: One of the main parameters of the device is its functional suitability. During operation device components under environmental change their parameters, ie, the process of aging. Under these conditions, there is a problem of evaluating functional fitness device taking into account the real processes of aging.
Rights: © University of West Bohemia
Appears in Collections:CPEE – AMTEE 2013
CPEE – AMTEE 2013

Files in This Item:
File Description SizeFormat 
Stakhiv.pdfPlný text119,07 kBAdobe PDFView/Open


Please use this identifier to cite or link to this item: http://hdl.handle.net/11025/11625

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.