Title: | Evaluation of the functional suitability of the device considering the technological parameters of random deviations from the nominal component aging processes |
Authors: | Stakhiv, Petro Krepych, Svitlana Bobalo, Yuriy |
Citation: | CPEE – AMTEE 2013: Joint conference Computational Problems of Electrical Engineering and Advanced Methods of the Theory of Electrical Engineering: 4th – 6th September 2013 Roztoky u Křivoklátu, Czech Republic, p. VII-5. |
Issue Date: | 2013 |
Publisher: | University of West Bohemia |
Document type: | článek konferenční příspěvek article conferenceObject |
URI: | http://hdl.handle.net/11025/11559 |
ISBN: | 978-80-261-0247-2 |
Keywords: | elektrická zařízení;procesy stárnutí;funkční vhodnost zařízení |
Keywords in different language: | electric devices;aging processes;functional device suitability |
Abstract: | One of the main parameters of the device is its functional suitability. During operation device components under environmental change their parameters, ie, the process of aging. Under these conditions, there is a problem of evaluating functional fitness device taking into account the real processes of aging. |
Rights: | © University of West Bohemia |
Appears in Collections: | CPEE – AMTEE 2013 CPEE – AMTEE 2013 |
Files in This Item:
File | Description | Size | Format | |
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Stakhiv.pdf | Plný text | 119,07 kB | Adobe PDF | View/Open |
Please use this identifier to cite or link to this item:
http://hdl.handle.net/11025/11625
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