Title: | Robust Bias Corrected Least Squares Fitting of Ellipses |
Authors: | Halíř, Radim |
Citation: | WSCG '2000: Conference proceeding: The 8th International Conference in Central Europe on Computers Graphics, Visualization and Interaktive Digital Media '2000 in cooperation with EUROGRAPHICS and IFIP WG 5.10: University of West Bohemia, Plzen, Czech republic, February 7 - 10, 2000, p. 36-43. |
Issue Date: | 2000 |
Publisher: | University of West Bohemia |
Document type: | konferenční příspěvek conferenceObject |
URI: | http://wscg.zcu.cz/wscg2000/Papers_2000/T3.ps.gz http://hdl.handle.net/11025/15426 |
ISBN: | 80-7082-612-6 |
Keywords: | elipsa;nejmenší čtverce;rozpoznávání vzorců;M estimátory |
Keywords in different language: | ellipse;least squares;pattern recognition;M-estimators |
Abstract: | This paper presents a robust and accurate technique for an estimation of the best-fit ellipse going through the given set of points. The approach is based on a least squares minimization of algebraic distances of the points with a correction of the statistical bias caused during the computation. An accurate ellipse-specific solution is guaranteed even for scattered or noisy data with outliers. Although the final algorithm is iterative, it typically converges in a fraction of time needed for a true orthogonal fitting based on Eucleidan distances of points. |
Rights: | © University of West Bohemia |
Appears in Collections: | WSCG '2000: Conference proceeding |
Please use this identifier to cite or link to this item:
http://hdl.handle.net/11025/15426
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