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dc.contributor.authorTeodorescu, Horia-Nicolai
dc.contributor.authorCojocaru, Victor
dc.contributor.authorKatashev, Alexei
dc.contributor.editorPinker, Jiří
dc.date.accessioned2019-10-21T06:00:21Z
dc.date.available2019-10-21T06:00:21Z
dc.date.issued2019
dc.identifier.citation2019 International Conference on Applied Electronics: Pilsen, 10th – 11th September 2019, Czech Republic, p. 173-176.en
dc.identifier.isbn978–80–261–0812–2 (Online)
dc.identifier.isbn978–80–261–0813–9 (Print)
dc.identifier.issn1803–7232 (Print)
dc.identifier.issn1805-9597 (Online)
dc.identifier.urihttp://hdl.handle.net/11025/35538
dc.format4 s.cs
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherZápadočeská univerzita v Plznics
dc.rights© Západočeská univerzita v Plznics
dc.subjectposuzování uniformitycs
dc.subjectpovrchové vlastnostics
dc.subjectkorelační analýzacs
dc.subjectAllanova variancecs
dc.subjectHadamardova variancecs
dc.titleMulti-Criterial Assessment of the Uniformity of the Electrical Potential of Micro-Filmsen
dc.typekonferenční příspěvekcs
dc.typeconferenceObjecten
dc.rights.accessopenAccessen
dc.type.versionpublishedVersionen
dc.description.abstract-translatedWe propose a method of characterization and assessment of the uniformity of the surface properties of samples based on a set of derived parameters. Local (sliding window) variance, Allan and Hadamard variances and centers of potential for measurement lines are used to assess the uniformity. The method is exemplified for the potential of piezoelectric thin (nano) films, but it is applicable to a large range of properties.en
dc.subject.translateduniformity assessmenten
dc.subject.translatedsurface propertiesen
dc.subject.translatedcorrelational analysisen
dc.subject.translatedAllan varianceen
dc.subject.translatedHadamard varianceen
dc.type.statusPeer-revieweden
Appears in Collections:Applied Electronics 2019
Applied Electronics 2019

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