Title: New Design Methodology – Using VHDL-AMS Models to Consider Aging Effects in Automotive Mechatronic Circuits for Safety Relevant Functions
Authors: Scharfenberg, Georg
Elis, Luděk
Hofmann, Gerhard
Citation: 2019 International Conference on Applied Electronics: Pilsen, 10th – 11th September 2019, Czech Republic, p. 141-146.
Issue Date: 2019
Publisher: Západočeská univerzita v Plzni
Document type: konferenční příspěvek
URI: http://hdl.handle.net/11025/35531
ISBN: 978–80–261–0812–2 (Online)
978–80–261–0813–9 (Print)
ISSN: 1803–7232 (Print)
1805-9597 (Online)
Keywords: funkční bezpečnost;metoda mechatronického návrhu;stárnutí rezistoru
Keywords in different language: functional safety;mechatronic design method;resistor aging
Abstract in different language: In this paper a design method for mechatronic functions in an early design phase under consideration of the requirements of functional safety is proposed [14]. The goal of the method is to discover threats for the safety goals and to prove or optimize the diagnostic mechanisms. At the current design process a lifetime endurance test is performed in a late project phase. In order to avoid unexpected late design changes the method should be applied in an early design phase. The method is an additional way to avoid design failures for E/E functions with special focus on aging in the field of functional safety applications. The method is developed out of three standards VDI 2221 methodology for development and construction of technical systems and products [1]), VDI 2206 design methodology for mechatronic systems [2] and the ISO 26262 road vehicles - Functional Safety [3] by using the V-Model. Furthermore, a core element of the design method is simulating aging effects by applying VHDL – AMS. To demonstrate the design methodology a sensor out of the EGAS function is chosen as a safety relevant automotive system. The limitation is the availability of aging data for electrical components.
Rights: © Západočeská univerzita v Plzni
Appears in Collections:Články / Articles (KAE)
Applied Electronics 2019
Applied Electronics 2019

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