Title: Multi-Criterial Assessment of the Uniformity of the Electrical Potential of Micro-Films
Authors: Teodorescu, Horia-Nicolai
Cojocaru, Victor
Katashev, Alexei
Citation: 2019 International Conference on Applied Electronics: Pilsen, 10th – 11th September 2019, Czech Republic, p. 173-176.
Issue Date: 2019
Publisher: Západočeská univerzita v Plzni
Document type: konferenční příspěvek
URI: http://hdl.handle.net/11025/35538
ISBN: 978–80–261–0812–2 (Online)
978–80–261–0813–9 (Print)
ISSN: 1803–7232 (Print)
1805-9597 (Online)
Keywords: posuzování uniformity;povrchové vlastnosti;korelační analýza;Allanova variance;Hadamardova variance
Keywords in different language: uniformity assessment;surface properties;correlational analysis;Allan variance;Hadamard variance
Abstract in different language: We propose a method of characterization and assessment of the uniformity of the surface properties of samples based on a set of derived parameters. Local (sliding window) variance, Allan and Hadamard variances and centers of potential for measurement lines are used to assess the uniformity. The method is exemplified for the potential of piezoelectric thin (nano) films, but it is applicable to a large range of properties.
Rights: © Západočeská univerzita v Plzni
Appears in Collections:Applied Electronics 2019
Applied Electronics 2019

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